                     SEMITEST REV. 2.0 Notes

SemiTes i  SemiDis tes progra desig t provid th use 
wit  mean o confidenc testin th SemiDis an assis i 
trouble shooting problems which may arise.

SemiTes i usuall provide i tw assemble䠠 versions 
TEST512K.CO͠ fo th 512 SemiDis an TEST1MEG.CO fo th on 
megabyt SemiDisk  Th use ca assembl th sourc file 
SEMITEST.ASM fo us wit  On an one-hal Ma o Tw Megabyt 
SemiDrive  (Note SEMITEST.CO͠ assembl require MAC.COM  
Macro Assembler from Digital Research, Inc.)

User wh ar operatin thei SemiDriv a som BASŠ addres 
othe tha 8 He wil nee t chang th BAS addres i th 
Sourc fil an reassembl usin MAC 

I an consol ke i type durin  test th progra wil exi 
t th initia men afte th presen pas i complete  I th 
characte type i  Control-C th progra wil exi t CP/ a 
th en o th curren tes segment.

TEST firs read eac SemiDriv locatio expectin t fin al 
zeros  I a erro i found th Erro Ma i update wit th 
locatio o o th defectiv chi an th Failur counte i 
incremented  Afte eac locatio i read F Hex al ones i 
writte befor th addres i incremente t th nex location 
Read-Modify-Write  Addres incrementin fo thi tes i Track 
first the Sectors  Tha is al o Secto 0' ar writte o 
al th Track befor th Secto coun i incremente tSecto 1.
A activit do i printe a th Secto coun i incremented  
A Erro Ma i printe afte thi segmen o th test.

 secon cycl throug al addres location expect t rea th 
one writte durin th previou Read-Modify-Writ pass  A i 
th previou tes segment addres incrementin i Track befor 
Sectors   An error ar logge t th Erro Ma an th Failur 
coun i incremented  A activit do i printe a th Secto 
coun i incremented  A Erro Ma i printe a th en o thi 
segmen o th test.

TEST2 th Incrementin Byt tes i  Write-Rea tes whic 
make tw cycles throug th SemiDisk  Th firs cycle write 
dat whic i incremente afte eac byt i writte s tha eac 
byt堠 withi  secto wil contai uniqu data  Addres 
incrementin i Trac befor Sector  A activit do i printe 
a th Secto i incremented.

Th secon cycle read th dat an compare i wit th byt 
whic wa written  Error ar logge t th Erro Ma an th 
Failur coun i incremented A activit do i printe a th 
Secto coun i incremented  A th en o thi tes th bas 
tes byt i complemente an shifte lef on positio t for 
th bas tes byt fo th nex tes pass  A Erro Ma i 
printe a th en o thi tes segment.
TEST start b clearin th SemiDrive  Thi i followe b 
eigh Read-Write-Rea cycles  Th ol tes byt i read  ne 
tes byt writte an the th ne tes byt i rea a eac 
locatio i th SemiDisk  Erro ar logge t th Erro Ma a 
the ar encountere an th Failur coun i incremented  
Addres incrementin i Sector befor Tracks  Test byte ar 
organize i odd/eve parit pair whic assur   maximu o 
parit stat switching  A activit do i printe a th star 
o eac cycle.  TEST3 may appear to run slowly.  

Tes byte ar take fro  tabl whic occur a th ver en o 
th program  Th use ca expan o chang thi tabl wit 
DDT.CO͠ withou th nee fo reassembly  Th las byt i th 
tabl mus b  0 fo th tes t terminat properly.

Afte TEST a Erro Ma i printe wit som tes statistics  
I th singl pas optio wa selected o i  consol characte 
wa entere durin th tes pass th progara wil exi t th 
initia menu  I th Foreve optio ha bee selected TEST an 
TEST wil repea unti interrupted  (Note TEST write 
different data each pass)

A th beginnin o eac ne pass th Failur counte i rese 
but the Error Map is not, allowing failed chips to accumulate.

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